%0 Journal Article
%A Ouaj, Taoufiq
%A Arnold, Christophe
%A Azpeitia, Jon
%A Baltic, Sunaja
%A Barjon, Julien
%A Cascales, José
%A Cun, Huanyao
%A Esteban, David
%A Garcia-Hernandez, Mar
%A Garnier, Vincent
%A Gautam, Subodh K
%A Greber, Thomas
%A Said Hassani, Said
%A Hemmi, Adrian
%A Jiménez, Ignacio
%A Journet, Catherine
%A Kögerler, Paul
%A Loiseau, Annick
%A Maestre, Camille
%A Metzelaars, Marvin
%A Schmidt, Philipp
%A Stampfer, Christoph
%A Stenger, Ingrid
%A Steyer, Philippe
%A Taniguchi, Takashi
%A Toury, Bérangère
%A Watanabe, Kenji
%A Beschoten, Bernd
%T Benchmarking the integration of hexagonal boron nitride crystals and thin films into graphene-based van der Waals heterostructures
%J 2D Materials
%V 12
%N 1
%@ 2053-1583
%C Bristol
%I IOP Publ.
%M FZJ-2024-07204
%P 015017 -
%D 2025
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:001378556600001
%R 10.1088/2053-1583/ad96c9
%U https://juser.fz-juelich.de/record/1034423