TY  - JOUR
AU  - Cabrera-Galicia, Alfonso R.
AU  - Ashok, Arun
AU  - Vliex, Patrick
AU  - Kruth, Andre
AU  - Zambanini, André
AU  - van Waasen, Stefan
TI  - Voltage Reference and Voltage Regulator for the Cryogenic Performance Evaluation of the 22nm FDSOI Technology
JO  - IEEE open journal of circuits and systems
VL  - 5
SN  - 2644-1225
CY  - New York, NY
PB  - IEEE
M1  - FZJ-2024-07279
SP  - 377 - 386
PY  - 2024
AB  - This paper presents the design and cryogenic electrical characterization of a voltage reference and a linear voltage regulator at temperatures between 6 K and 300 K. Both circuits are employed as test vehicles for the experimental performance evaluation of the 22 nm FDSOI MOS technology when used as platform for the development of cryogenic analog systems, whose role is relevant in Quantum Computing (QC) applications. Additionally, we report the impact that MOS transistor cryogenic phenomena have over these circuits and propose to take advantage of some of those phenomena in analog circuit design. In particular, we focus on the cryogenic threshold voltage (Vth) saturation, the transconductance (gm) increase and the low frequency (LF) excess noise. Our experimental results indicate that the cryogenic Vth saturation and the gm increase can be used as circuit design tools, while the LF excess noise is a performance handicap for cryogenic analog circuits.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001381324400003
DO  - DOI:10.1109/OJCAS.2024.3466395
UR  - https://juser.fz-juelich.de/record/1034516
ER  -