Home > Publications database > Voltage Reference and Voltage Regulator for the Cryogenic Performance Evaluation of the 22nm FDSOI Technology > print

001     1034516
005     20250312202213.0
024 7 _ |a 10.1109/OJCAS.2024.3466395
|2 doi
024 7 _ |a 10.34734/FZJ-2024-07279
|2 datacite_doi
024 7 _ |a WOS:001381324400003
|2 WOS
037 _ _ |a FZJ-2024-07279
041 _ _ |a English
082 _ _ |a 004
100 1 _ |a Cabrera-Galicia, Alfonso R.
|0 P:(DE-Juel1)177765
|b 0
|e Corresponding author
245 _ _ |a Voltage Reference and Voltage Regulator for the Cryogenic Performance Evaluation of the 22nm FDSOI Technology
260 _ _ |a New York, NY
|c 2024
|b IEEE
336 7 _ |a article
|2 DRIVER
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|b journal
|m journal
|0 PUB:(DE-HGF)16
|s 1734684430_26302
|2 PUB:(DE-HGF)
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a Journal Article
|0 0
|2 EndNote
520 _ _ |a This paper presents the design and cryogenic electrical characterization of a voltage reference and a linear voltage regulator at temperatures between 6 K and 300 K. Both circuits are employed as test vehicles for the experimental performance evaluation of the 22 nm FDSOI MOS technology when used as platform for the development of cryogenic analog systems, whose role is relevant in Quantum Computing (QC) applications. Additionally, we report the impact that MOS transistor cryogenic phenomena have over these circuits and propose to take advantage of some of those phenomena in analog circuit design. In particular, we focus on the cryogenic threshold voltage (Vth) saturation, the transconductance (gm) increase and the low frequency (LF) excess noise. Our experimental results indicate that the cryogenic Vth saturation and the gm increase can be used as circuit design tools, while the LF excess noise is a performance handicap for cryogenic analog circuits.
536 _ _ |a 5223 - Quantum-Computer Control Systems and Cryoelectronics (POF4-522)
|0 G:(DE-HGF)POF4-5223
|c POF4-522
|f POF IV
|x 0
588 _ _ |a Dataset connected to CrossRef, Journals: juser.fz-juelich.de
700 1 _ |a Ashok, Arun
|0 P:(DE-Juel1)176328
|b 1
700 1 _ |a Vliex, Patrick
|0 P:(DE-Juel1)171680
|b 2
700 1 _ |a Kruth, Andre
|0 P:(DE-Juel1)156521
|b 3
700 1 _ |a Zambanini, André
|0 P:(DE-Juel1)145837
|b 4
700 1 _ |a van Waasen, Stefan
|0 P:(DE-Juel1)142562
|b 5
773 _ _ |a 10.1109/OJCAS.2024.3466395
|g Vol. 5, p. 377 - 386
|0 PERI:(DE-600)3012070-6
|p 377 - 386
|t IEEE open journal of circuits and systems
|v 5
|y 2024
|x 2644-1225
856 4 _ |u https://juser.fz-juelich.de/record/1034516/files/Voltage_Reference_and_Voltage_Regulator_for_the_Cryogenic_Performance_Evaluation_of_the_22nm_FDSOI_Technology.pdf
|y OpenAccess
909 C O |o oai:juser.fz-juelich.de:1034516
|p openaire
|p open_access
|p driver
|p VDB
|p openCost
|p dnbdelivery
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 0
|6 P:(DE-Juel1)177765
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 1
|6 P:(DE-Juel1)176328
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 2
|6 P:(DE-Juel1)171680
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 3
|6 P:(DE-Juel1)156521
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 4
|6 P:(DE-Juel1)145837
910 1 _ |a Forschungszentrum Jülich
|0 I:(DE-588b)5008462-8
|k FZJ
|b 5
|6 P:(DE-Juel1)142562
913 1 _ |a DE-HGF
|b Key Technologies
|l Natural, Artificial and Cognitive Information Processing
|1 G:(DE-HGF)POF4-520
|0 G:(DE-HGF)POF4-522
|3 G:(DE-HGF)POF4
|2 G:(DE-HGF)POF4-500
|4 G:(DE-HGF)POF
|v Quantum Computing
|9 G:(DE-HGF)POF4-5223
|x 0
914 1 _ |y 2024
915 _ _ |a Creative Commons Attribution-NonCommercial-NoDerivs CC BY-NC-ND 4.0
|0 LIC:(DE-HGF)CCBYNCND4
|2 HGFVOC
915 _ _ |a Fees
|0 StatID:(DE-HGF)0700
|2 StatID
|d 2023-08-19
915 _ _ |a OpenAccess
|0 StatID:(DE-HGF)0510
|2 StatID
915 _ _ |a Article Processing Charges
|0 StatID:(DE-HGF)0561
|2 StatID
|d 2023-08-19
915 _ _ |a JCR
|0 StatID:(DE-HGF)0100
|2 StatID
|b IEEE OPEN J CIRCUITS : 2022
|d 2024-12-18
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0200
|2 StatID
|b SCOPUS
|d 2024-12-18
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0300
|2 StatID
|b Medline
|d 2024-12-18
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0501
|2 StatID
|b DOAJ Seal
|d 2024-04-03T10:39:05Z
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0500
|2 StatID
|b DOAJ
|d 2024-04-03T10:39:05Z
915 _ _ |a Peer Review
|0 StatID:(DE-HGF)0030
|2 StatID
|b DOAJ : Anonymous peer review
|d 2024-04-03T10:39:05Z
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0199
|2 StatID
|b Clarivate Analytics Master Journal List
|d 2024-12-18
915 _ _ |a WoS
|0 StatID:(DE-HGF)0112
|2 StatID
|b Emerging Sources Citation Index
|d 2024-12-18
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0150
|2 StatID
|b Web of Science Core Collection
|d 2024-12-18
915 _ _ |a IF < 5
|0 StatID:(DE-HGF)9900
|2 StatID
|d 2024-12-18
915 p c |a APC keys set
|2 APC
|0 PC:(DE-HGF)0000
915 p c |a Local Funding
|2 APC
|0 PC:(DE-HGF)0001
915 p c |a DFG OA Publikationskosten
|2 APC
|0 PC:(DE-HGF)0002
915 p c |a DOAJ Journal
|2 APC
|0 PC:(DE-HGF)0003
920 _ _ |l yes
920 1 _ |0 I:(DE-Juel1)ZEA-2-20090406
|k ZEA-2
|l Zentralinstitut für Elektronik
|x 0
980 1 _ |a FullTexts
980 _ _ |a journal
980 _ _ |a VDB
980 _ _ |a UNRESTRICTED
980 _ _ |a I:(DE-Juel1)ZEA-2-20090406
980 _ _ |a APC
981 _ _ |a I:(DE-Juel1)PGI-4-20110106

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