TY  - JOUR
AU  - Reiser, D.
AU  - Brenzke, M.
AU  - Wiesen, S.
TI  - Parameter identification by eigenfeature analysis: application to 2D Kuramoto-Sivashinsky surface models
JO  - Surface topography
VL  - 12
IS  - 3
SN  - 2051-672X
CY  - London
PB  - Institute of Physics
M1  - FZJ-2024-07458
SP  - 035029 -
PY  - 2024
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001291804600001
DO  - DOI:10.1088/2051-672X/ad6b3d
UR  - https://juser.fz-juelich.de/record/1034701
ER  -