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@ARTICLE{Rodriguez:1034979,
author = {Rodriguez, N. and Gontard, L. and Ma, C. and Xu, Ruibin and
Persson, Bo},
title = {{O}n {H}ow to {D}etermine {S}urface {R}oughness {P}ower
{S}pectra},
journal = {Tribology letters},
volume = {73},
number = {1},
issn = {1023-8883},
address = {Dordrecht},
publisher = {Springer Science Business Media B.V.},
reportid = {FZJ-2025-00085},
pages = {18},
year = {2025},
abstract = {Analytical contact mechanics theories depend on surface
roughness through the surface roughness power spectrum. In
the present study, we evaluated the usability of various
experimental methods for studying surface roughness. Our
findings indicated that height data obtained from optical
methods often lack accuracy and should not be utilized for
calculating surface roughness power spectra. Conversely,
engineering stylus instruments and atomic force microscopy
(AFM) typically yield reliable results that are consistent
across the overlapping roughness length scale region. For
surfaces with isotropic roughness, the two-dimensional (2D)
power spectrum can be derived from the one-dimensional (1D)
power spectrum using several approaches, which we explored
in this paper.},
cin = {PGI-1},
ddc = {670},
cid = {I:(DE-Juel1)PGI-1-20110106},
pnm = {5211 - Topological Matter (POF4-521)},
pid = {G:(DE-HGF)POF4-5211},
typ = {PUB:(DE-HGF)16},
UT = {WOS:001385133500001},
doi = {10.1007/s11249-024-01933-6},
url = {https://juser.fz-juelich.de/record/1034979},
}