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@ARTICLE{Zheng:1038049,
      author       = {Zheng, Jianzha and Ning, Dan and Li, Yang and Wang,
                      Yousheng and Ma, Qiaoyan and Liu, Liming and Yang, Peng and
                      He, Wujie and Yang, Huidong and Duan, Weiyuan and Zhu,
                      Hongbing and Chen, Shi and Lambertz, Andreas and Ding,
                      Kaining and Mai, Yaohua},
      title        = {{H}ybrid interconnecting layers reduce current leakage
                      losses in perovskite/silicon tandems with $81.8\%$ fill
                      factor},
      journal      = {Cell reports / Physical science},
      volume       = {5},
      number       = {8},
      issn         = {2666-3864},
      address      = {Maryland Heights, MO},
      publisher    = {Cell Press},
      reportid     = {FZJ-2025-01098},
      pages        = {102114},
      year         = {2024},
      cin          = {IEK-5},
      ddc          = {530},
      cid          = {I:(DE-Juel1)IEK-5-20101013},
      pnm          = {1213 - Cell Design and Development (POF4-121)},
      pid          = {G:(DE-HGF)POF4-1213},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:001300363600001},
      doi          = {10.1016/j.xcrp.2024.102114},
      url          = {https://juser.fz-juelich.de/record/1038049},
}