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@ARTICLE{Waser:10410,
author = {Waser, R. and Dittmann, R. and Salinga, M. and Wuttig, M.},
title = {{F}unction by defects at the atomic scale - {N}ew concepts
for non-volatile memories},
journal = {Solid state electronics},
volume = {54},
issn = {0038-1101},
address = {Oxford [u.a.]},
publisher = {Pergamon, Elsevier Science},
reportid = {PreJuSER-10410},
pages = {830 - 840},
year = {2010},
note = {Record converted from VDB: 12.11.2012},
abstract = {A survey of non-volatile. highly scalable memory devices
which utilize dedicated resistive switching phenomena in
nanoscale chalcogenide-based memory cells is presented. We
introduce the basic operation principle of the phase change
mechanism, the thermochemical mechanism, and the valence
change mechanism and we discuss the crucial role of
structural defects in the switching processes. We show how
this role is determined by the atomic structure of the
defects, the electronic defect states, and/or the ion
transport properties of the defects. The electronic
structure of the systems in different resistance states is
described in the light of the chemical bonds involved. While
for phase-change alloys the interplay of ionicity and
hybridization in the crystalline and in the amorphous phase
determine the resistances, the local redox reaction at the
site of extended defects, the change in the oxygen
stoichiometry, and the resulting change in the occupancy of
relevant orbitals play the major role in the thermochemical
and the valence change mechanism. Phase transformations are
not only discussed for phase-change alloys but also for both
other types of switching processes. The switching kinetics
as well as the ultimate scalability of switching cells is
related to structural defects in the materials. (C) 2010
Elsevier Ltd. All rights reserved.},
keywords = {J (WoSType)},
cin = {IFF-6 / JARA-FIT},
ddc = {530},
cid = {I:(DE-Juel1)VDB786 / $I:(DE-82)080009_20140620$},
pnm = {Grundlagen für zukünftige Informationstechnologien},
pid = {G:(DE-Juel1)FUEK412},
shelfmark = {Engineering, Electrical $\&$ Electronic / Physics, Applied
/ Physics, Condensed Matter},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000280322300004},
doi = {10.1016/j.sse.2010.04.043},
url = {https://juser.fz-juelich.de/record/10410},
}