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@ARTICLE{Ridgard:1041106,
      author       = {Ridgard, G. and Thompson, M. and Schreckenberg, Lea and
                      Deshpande, Nihal and Cabrera-Galicia, A. and Bourgeois, O.
                      and Doebele, V. and Prance, J.},
      title        = {{V}oltage {N}oise {T}hermometry in {I}ntegrated {C}ircuits
                      at {M}illikelvin {T}emperatures},
      publisher    = {arXiv},
      reportid     = {FZJ-2025-02147},
      year         = {2025},
      abstract     = {This paper demonstrates the use of voltage noise
                      thermometry, with a cross-correlation technique, as a
                      dissipation-free method of thermometry inside a CMOS
                      integrated circuit (IC). We show that this technique
                      exhibits broad agreement with the refrigerator temperature
                      range from 300 mK to 8 K. Furthermore, it shows substantial
                      agreement with both an independent in-IC thermometry
                      technique and a simple thermal model as a function of power
                      dissipation inside the IC. As the device under test (DUT) is
                      a resistor, it is feasible to extend this technique by
                      placing many resistors in an IC to monitor the local
                      temperatures, without increasing IC design complexity. This
                      could lead to better understanding of the thermal profile of
                      ICs at cryogenic temperatures. This has its greatest
                      potential application in quantum computing, where the
                      temperature at the cold classical-quantum boundary must be
                      carefully controlled to maintain qubit performance.},
      keywords     = {Applied Physics (physics.app-ph) (Other) / FOS: Physical
                      sciences (Other)},
      cin          = {PGI-4},
      cid          = {I:(DE-Juel1)PGI-4-20110106},
      pnm          = {5223 - Quantum-Computer Control Systems and Cryoelectronics
                      (POF4-522)},
      pid          = {G:(DE-HGF)POF4-5223},
      typ          = {PUB:(DE-HGF)25},
      doi          = {10.48550/ARXIV.2502.16661},
      url          = {https://juser.fz-juelich.de/record/1041106},
}