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@ARTICLE{Ridgard:1041106,
author = {Ridgard, G. and Thompson, M. and Schreckenberg, Lea and
Deshpande, Nihal and Cabrera-Galicia, A. and Bourgeois, O.
and Doebele, V. and Prance, J.},
title = {{V}oltage {N}oise {T}hermometry in {I}ntegrated {C}ircuits
at {M}illikelvin {T}emperatures},
publisher = {arXiv},
reportid = {FZJ-2025-02147},
year = {2025},
abstract = {This paper demonstrates the use of voltage noise
thermometry, with a cross-correlation technique, as a
dissipation-free method of thermometry inside a CMOS
integrated circuit (IC). We show that this technique
exhibits broad agreement with the refrigerator temperature
range from 300 mK to 8 K. Furthermore, it shows substantial
agreement with both an independent in-IC thermometry
technique and a simple thermal model as a function of power
dissipation inside the IC. As the device under test (DUT) is
a resistor, it is feasible to extend this technique by
placing many resistors in an IC to monitor the local
temperatures, without increasing IC design complexity. This
could lead to better understanding of the thermal profile of
ICs at cryogenic temperatures. This has its greatest
potential application in quantum computing, where the
temperature at the cold classical-quantum boundary must be
carefully controlled to maintain qubit performance.},
keywords = {Applied Physics (physics.app-ph) (Other) / FOS: Physical
sciences (Other)},
cin = {PGI-4},
cid = {I:(DE-Juel1)PGI-4-20110106},
pnm = {5223 - Quantum-Computer Control Systems and Cryoelectronics
(POF4-522)},
pid = {G:(DE-HGF)POF4-5223},
typ = {PUB:(DE-HGF)25},
doi = {10.48550/ARXIV.2502.16661},
url = {https://juser.fz-juelich.de/record/1041106},
}