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@ARTICLE{Leis:1041555,
author = {Leis, Arthur and Cherepanov, Vasily and Voigtländer, Bert
and Tautz, Frank Stefan},
title = {{N}anoscale tip positioning with a multi-tip scanning
tunneling microscope using topography images},
publisher = {arXiv},
reportid = {FZJ-2025-02312},
year = {2022},
abstract = {Multi-tip scanning tunneling microscopy (STM) is a powerful
method to perform charge transport measurements at the
nanoscale. With four STM tips positioned on the surface of a
sample, four-point resistance measurements can be performed
in dedicated geometric configurations. Here, we present an
alternative to the most often used scanning electron
microscope (SEM) imaging to infer the corresponding tip
positions. After initial coarse positioning monitored by an
optical microscope, STM scanning itself is used to determine
the inter-tip distances. A large STM overview scan serves as
a reference map. Recognition of the same topographic
features in the reference map and in small scale images with
the individual tips allows to identify the tip positions
with an accuracy of about 20 nm for a typical tip spacing of
~1 $μ$m. In order to correct for effects like the
non-linearity of the deflection, creep and hysteresis of the
piezo-electric elements of the STM, a careful calibration
has to be performed.},
keywords = {Mesoscale and Nanoscale Physics (cond-mat.mes-hall) (Other)
/ FOS: Physical sciences (Other)},
cin = {PGI-3},
cid = {I:(DE-Juel1)PGI-3-20110106},
pnm = {5213 - Quantum Nanoscience (POF4-521)},
pid = {G:(DE-HGF)POF4-5213},
typ = {PUB:(DE-HGF)25},
doi = {10.48550/ARXIV.2201.11430},
url = {https://juser.fz-juelich.de/record/1041555},
}