%0 Journal Article
%A Padberg, Henriette
%A Espiari, Abbas
%A Schnieders, Kristoffer
%A Kiehn, Alexander
%A Jalil, Abdur R.
%A Waser, Rainer
%A Menzel, Stephan
%A Wiefels, Stefan
%T Automated Endurance Characterization of Phase Change Memory
%J IEEE access
%V 13
%@ 2169-3536
%C New York, NY
%I IEEE
%M FZJ-2025-02335
%P 71214 - 71222
%D 2025
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:001479454700047
%R 10.1109/ACCESS.2025.3562434
%U https://juser.fz-juelich.de/record/1041601