TY  - JOUR
AU  - Zhen, Erfei
AU  - Chen, Yanxia
AU  - Huang, Jun
TI  - Double-layer capacitance peaks: Origins, ion dependence, and temperature effects
JO  - The journal of chemical physics
VL  - 162
IS  - 14
SN  - 0021-9606
CY  - Melville, NY
PB  - American Institute of Physics
M1  - FZJ-2025-02337
SP  - 144702
PY  - 2025
LB  - PUB:(DE-HGF)16
DO  - DOI:10.1063/5.0251548
UR  - https://juser.fz-juelich.de/record/1041603
ER  -