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@ARTICLE{Ridgard:1043446,
      author       = {Ridgard, G. and Thompson, M. and Schreckenberg, L. and
                      Deshpande, Nihal and Cabrera-Galicia, A. and Bourgeois, O.
                      and Doebele, V. and Prance, J.},
      title        = {{V}oltage noise thermometry in integrated circuits at
                      millikelvin temperatures},
      journal      = {Journal of applied physics},
      volume       = {137},
      number       = {24},
      issn         = {0021-8979},
      address      = {Melville, NY},
      publisher    = {American Inst. of Physics},
      reportid     = {FZJ-2025-02872},
      pages        = {245901},
      year         = {2025},
      abstract     = {This paper demonstrates the use of voltage noise
                      thermometry, with a cross-correlation technique, as a
                      dissipation-free method of thermometry inside a CMOS
                      integrated circuit (IC). We show that this technique
                      exhibits broad agreement with the refrigerator temperature
                      range from 300 mK to 8 K. Furthermore, it shows substantial
                      agreement with both an independent in-IC thermometry
                      technique and a simple thermal model as a function of power
                      dissipation inside the IC. As the device under a test is a
                      resistor, it is feasible to extend this technique by placing
                      many resistors in an IC to monitor the local temperatures,
                      without increasing IC design complexity. This could lead to
                      better understanding of the thermal profile of ICs at
                      cryogenic temperatures. This has its greatest potential
                      application in quantum computing, where the temperature at
                      the cold classical-quantum boundary must be carefully
                      controlled to maintain qubit performance.},
      cin          = {PGI-4},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-4-20110106},
      pnm          = {5223 - Quantum-Computer Control Systems and Cryoelectronics
                      (POF4-522) / EMP - European Microkelvin Platform (824109)},
      pid          = {G:(DE-HGF)POF4-5223 / G:(EU-Grant)824109},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:001517689500013},
      doi          = {10.1063/5.0268728},
      url          = {https://juser.fz-juelich.de/record/1043446},
}