| Hauptseite > Publikationsdatenbank > Microstructure of Electrical Double Layers at Highly Charged States > RIS |
TY - JOUR AU - Zhang, Zengming AU - Huang, Jun TI - Microstructure of Electrical Double Layers at Highly Charged States JO - JACS Au VL - 5 SN - 2691-3704 CY - Washington, DC PB - ACS Publications M1 - FZJ-2025-03209 SP - jacsau.5c00508 PY - 2025 LB - PUB:(DE-HGF)16 DO - DOI:10.1021/jacsau.5c00508 UR - https://juser.fz-juelich.de/record/1044467 ER -