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@INPROCEEDINGS{Buerhop:1046018,
      author       = {Buerhop, Claudia and De Oliveira, Aline Kirsten Vidal and
                      Mashkov, Oleskandr and Nascimento, Lucas and Braga, Marília
                      and Rüther, Ricardo and Peters, Ian Marius},
      title        = {{C}ombined {N}on-{D}estructive {T}echniques for {O}n-{S}ite
                      {F}ailure {A}nalysis -{S}howcase of {G}lass {C}racks with
                      {B}urn {M}arks in a {PV} {P}ower {S}tation},
      publisher    = {IEEE},
      reportid     = {FZJ-2025-03658},
      pages        = {-},
      year         = {2025},
      abstract     = {Reliability of PV modules is important for power production
                      and to maximize energy yield. Module faults represent a
                      potential risk of yield loss when their causes and
                      implications are unclear. We present a strategy to
                      efficiently perform failure analysis in solar power parks
                      with simple methods using the example of double glass
                      modules with glass cracks and burn marks in a single-axis
                      tracking multi-MWp PV power plant. In a sample of 984
                      modules, $8.5\%$ exhibited glass cracks, with $86\%$ of
                      these located directly next to the tracker elements, as
                      detected by visual inspection. Some $34\%$ of the 180
                      modules next to the tracker had glass cracks and $47\%$ of
                      these also had burn marks. IR and UVF imaging showed
                      anomalies for all modules with glass cracks and for another
                      $15\%$ that had no glass cracks. The targeted use of
                      electroluminescence and for the first time in superposition
                      with UVF imaging highlights deactivated cell areas with
                      local hotspots. Our hypothesis is that due to short cables
                      mechanical stresses are transferred to the junction box and
                      weaken the solder joints to such an extent that temperature
                      increases with glass cracks and burn marks are the result.
                      Through the consistent use of simple methods of an extensive
                      sample and the targeted use of more complex methods, the
                      vulnerable positions of the modules next to the tracker
                      could be identified; we estimate that approx. $33-46\%$ of
                      the modules next to the tracker in this power plant could
                      have been affected.},
      month         = {Jun},
      date          = {2025-06-08},
      organization  = {2025 IEEE 53rd Photovoltaic
                       Specialists Conference (PVSC), Montreal
                       (Canada), 8 Jun 2025 - 13 Jun 2025},
      cin          = {IET-2},
      cid          = {I:(DE-Juel1)IET-2-20140314},
      pnm          = {1212 - Materials and Interfaces (POF4-121)},
      pid          = {G:(DE-HGF)POF4-1212},
      typ          = {PUB:(DE-HGF)8},
      doi          = {10.1109/PVSC59419.2025.11132595},
      url          = {https://juser.fz-juelich.de/record/1046018},
}