TY  - JOUR
AU  - Menzel, Stephan
AU  - Schon, Daniel
AU  - Munir, Faisal
AU  - Stasner, Pascal
AU  - Wiefels, Stefan
TI  - Exploiting thermal accumulation on sub-ns timescales for tuning potentiation of RRAM
JO  - IEEE electron device letters
VL  - 46
IS  - 11
SN  - 0193-8576
CY  - New York, NY
PB  - IEEE
M1  - FZJ-2025-03820
SP  - 2018-2021
PY  - 2025
LB  - PUB:(DE-HGF)16
DO  - DOI:10.1109/LED.2025.3612742
UR  - https://juser.fz-juelich.de/record/1046468
ER  -