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001047291 1001_ $$00009-0001-7592-7674$$aTilgner, Niclas$$b0$$eFirst author
001047291 245__ $$aSolving the phase problem of diffraction: x-ray standing wave imaging on bismuthene/SiC(0001)
001047291 260__ $$aBristol$$bIOP Publ.$$c2025
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001047291 520__ $$aFor establishing a fundamental understanding of the emerging properties of two-dimensional (2D) materials, a reliable determination of the crystallographic structure is essential, as we demonstrate in this work for the specific case of the quantum spin Hall insulator bismuthene. Diffraction-based methods are widely used for structure determination, however, they suffer from a fundamental shortcoming, the phase retrieval problem, that is the inability to directly measure the phase of scattered waves. The normal incidence x-ray standing wave (NIXSW) technique circumvents this problem by introducing a Bragg-generated x-ray standing wave field throughout the sample, relative to which any atomic species can be localized. In essence, a single NIXSW measurement captures the complex scattering factor (amplitude and phase) corresponding to one single Bragg reflection. Collecting data for multiple reflections enables a three-dimensional reconstruction of the scattering density as the Fourier sum of all measured scattering factors. Here, we utilize this technique to reveal the mechanism of a reversible switching process that has been reported for a 2D Bi layer recently (Tilgner et al 2025 Nat. Commun. 16, 6171). In this prominent example, the Bi layer is confined between a 4H-SiC substrate and an epitaxial graphene layer, and can be reversibly switched between an electronically inactive precursor state and the bismuthene state. In our NIXSW imaging experiment, we clearly identify the change of the adsorption site of the Bi atoms, caused by H-saturation of one out of three Si dangling bonds per unit cell, as the key feature leading to the formation of the characteristic band structure of the 2D bismuthene honeycomb.
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001047291 536__ $$0G:(GEPRIS)470743959$$aDFG project G:(GEPRIS)470743959 - Untersuchung der Transporteigenschaften von interkaliertem Graphene auf atomarer Skala (470743959)$$c470743959$$x1
001047291 536__ $$0G:(GEPRIS)385975694$$aSFB 1083 A12 - Struktur und Anregungen von hetero-epitaktischen Schichtsystemen aus schwach wechselwirkenden 2D-Materialien und molekularen Schichten (A12) (385975694)$$c385975694$$x2
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001047291 7001_ $$00009-0003-6480-9319$$aWolff, Susanne$$b1
001047291 7001_ $$0P:(DE-Juel1)128790$$aSoubatch, Serguei$$b2
001047291 7001_ $$0P:(DE-HGF)0$$aLee, Tien-Lin$$b3
001047291 7001_ $$00000-0003-2299-2445$$aGöhler, Fabian$$b4
001047291 7001_ $$0P:(DE-Juel1)128791$$aTautz, F Stefan$$b5
001047291 7001_ $$00000-0002-4953-2142$$aSeyller, Thomas$$b6
001047291 7001_ $$00000-0002-0075-2291$$aSchädlich, Philip$$b7$$eCorresponding author
001047291 7001_ $$0P:(DE-Juel1)128774$$aKumpf, Christian$$b8$$eCorresponding author
001047291 773__ $$0PERI:(DE-600)2779376-X$$a10.1088/2053-1583/ae0f27$$gVol. 12, no. 4, p. 045020 -$$n4$$p045020$$t2D Materials$$v12$$x2053-1583$$y2025
001047291 8564_ $$uhttps://iopscience.iop.org/article/10.1088/2053-1583/ae0f27
001047291 8564_ $$uhttps://juser.fz-juelich.de/record/1047291/files/Tilgner_2025_2D_Mater._12_045020.pdf$$yOpenAccess
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