TY  - JOUR
AU  - Woo, Kyung Seok
AU  - Kim, Gwangmin
AU  - Kim, Kyung Min
AU  - Kumar, Suhas
TI  - Role of heat in post-silicon electronics
JO  - Applied physics reviews
VL  - 12
IS  - 3
SN  - 1931-9401
CY  - New York, NY
PB  - AIP
M1  - FZJ-2025-04470
SP  - 031323
PY  - 2025
LB  - PUB:(DE-HGF)16
DO  - DOI:10.1063/5.0258988
UR  - https://juser.fz-juelich.de/record/1047704
ER  -