%0 Journal Article
%A Gasser, Fabian
%A Simbrunner, Josef
%A Huck, Marten
%A Moser, Armin
%A Steinrück, Hans-Georg
%A Resel, Roland
%T Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors
%J Journal of applied crystallography
%V 58
%N 1
%@ 0021-8898
%C Copenhagen
%I Munksgaard
%M FZJ-2025-04760
%P 96 - 106
%D 2025
%F PUB:(DE-HGF)16
%9 Journal Article
%R 10.1107/S1600576724010628
%U https://juser.fz-juelich.de/record/1048620