TY  - JOUR
AU  - Gasser, Fabian
AU  - Simbrunner, Josef
AU  - Huck, Marten
AU  - Moser, Armin
AU  - Steinrück, Hans-Georg
AU  - Resel, Roland
TI  - Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors
JO  - Journal of applied crystallography
VL  - 58
IS  - 1
SN  - 0021-8898
CY  - Copenhagen
PB  - Munksgaard
M1  - FZJ-2025-04760
SP  - 96 - 106
PY  - 2025
LB  - PUB:(DE-HGF)16
C6  - 39917192
UR  - <Go to ISI:>//WOS:001422067800010
DO  - DOI:10.1107/S1600576724010628
UR  - https://juser.fz-juelich.de/record/1048620
ER  -