%0 Journal Article
%A Schwarz, Julian
%A Dick, Jan
%A Beuer, Susanne
%A Rommel, Mathias
%A Hutzler, Andreas
%T Modeling the partially detected backside reflectance of transparent substrates in reflectance microspectroscopy
%J Micron
%V 198
%@ 0968-4328
%C New York, NY [u.a.]
%I Elsevier
%M FZJ-2025-05194
%P 103878 -
%D 2025
%F PUB:(DE-HGF)16
%9 Journal Article
%R 10.1016/j.micron.2025.103878
%U https://juser.fz-juelich.de/record/1049102