TY  - JOUR
AU  - Schwarz, Julian
AU  - Dick, Jan
AU  - Beuer, Susanne
AU  - Rommel, Mathias
AU  - Hutzler, Andreas
TI  - Modeling the partially detected backside reflectance of transparent substrates in reflectance microspectroscopy
JO  - Micron
VL  - 198
SN  - 0968-4328
CY  - New York, NY [u.a.]
PB  - Elsevier
M1  - FZJ-2025-05194
SP  - 103878 -
PY  - 2025
LB  - PUB:(DE-HGF)16
DO  - DOI:10.1016/j.micron.2025.103878
UR  - https://juser.fz-juelich.de/record/1049102
ER  -