Hauptseite > Publikationsdatenbank > Optimizing time-of-flight secondary ion mass spectrometry depth profiles of semiconductor heterostructures > print

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100 1 _ |a Tröger, Jan
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245 _ _ |a Optimizing time-of-flight secondary ion mass spectrometry depth profiles of semiconductor heterostructures
260 _ _ |a Melville, NY
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700 1 _ |a Kersting, Reinhard
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700 1 _ |a Hagenhoff, Birgit
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700 1 _ |a Bougeard, Dominique
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700 1 _ |a Abrosimov, Nikolay V.
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700 1 _ |a Klos, Jan
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700 1 _ |a Schreiber, Lars
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700 1 _ |a Bracht, Hartmut
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773 _ _ |a 10.1063/5.0232252
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