In-operando atomic force microscopy and high-resolution electron microscopy on functional layers in batteries &amp; electrolyzers

Hausen, Florian; Schierholz, Roland

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Home > Publications database > In-operando atomic force microscopy and high-resolution electron microscopy on functional layers in batteries & electrolyzers > EndNote Text

%0 Conference Paper
%A Hausen, Florian
%A Schierholz, Roland
%T In-operando atomic force microscopy and high-resolution electron microscopy on functional layers in batteries &amp; electrolyzers
%M FZJ-2026-00583
%D 2025
%B CSE Seminar - Argonne National Laboratory
%C ,  (USA)
M2 , USA
%F PUB:(DE-HGF)31
%9 Talk (non-conference)
%U https://juser.fz-juelich.de/record/1051675

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