%0 Conference Paper
%A Muster, P.
%A Langheinrich, W.
%A Huckemann, T.
%A Pregl, S.
%A Brackmann, V.
%A Friedrich, M.
%A Reichmann, F.
%A Komerički, N. D.
%A Schreiber, L. R.
%A Bluhm, H.
%T High-fidelity single-electron shuttling in industrially fabricated spin qubit devices
%I IEEE
%M FZJ-2026-01668
%P 111
%D 2025
%B 2025 IEEE International Electron Devices Meeting (IEDM)
%C 6 Dec 2025 - 10 Dec 2025, San Francisco (CA)
Y2 6 Dec 2025 - 10 Dec 2025
M2 San Francisco, CA
%F PUB:(DE-HGF)8
%9 Contribution to a conference proceedings
%R https://doi.org/10.1109/IEDM50572.2025.11353490
%U https://juser.fz-juelich.de/record/1054014