TY  - CONF
AU  - Muster, P.
AU  - Langheinrich, W.
AU  - Huckemann, T.
AU  - Pregl, S.
AU  - Brackmann, V.
AU  - Friedrich, M.
AU  - Reichmann, F.
AU  - Komerički, N. D.
AU  - Schreiber, L. R.
AU  - Bluhm, H.
TI  - High-fidelity single-electron shuttling in industrially fabricated spin qubit devices
PB  - IEEE
M1  - FZJ-2026-01668
SP  - 111
PY  - 2025
T2  - 2025 IEEE International Electron Devices Meeting (IEDM)
CY  - 6 Dec 2025 - 10 Dec 2025, San Francisco (CA)
Y2  - 6 Dec 2025 - 10 Dec 2025
M2  - San Francisco, CA
LB  - PUB:(DE-HGF)8
DO  - DOI:https://doi.org/10.1109/IEDM50572.2025.11353490
UR  - https://juser.fz-juelich.de/record/1054014
ER  -