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@INPROCEEDINGS{Muster:1054014,
      author       = {Muster, P. and Langheinrich, W. and Huckemann, T. and
                      Pregl, S. and Brackmann, V. and Friedrich, M. and Reichmann,
                      F. and Komerički, N. D. and Schreiber, L. R. and Bluhm, H.},
      title        = {{H}igh-fidelity single-electron shuttling in industrially
                      fabricated spin qubit devices},
      publisher    = {IEEE},
      reportid     = {FZJ-2026-01668},
      pages        = {111},
      year         = {2025},
      month         = {Dec},
      date          = {2025-12-06},
      organization  = {2025 IEEE International Electron
                       Devices Meeting (IEDM), San Francisco
                       (CA), 6 Dec 2025 - 10 Dec 2025},
      cin          = {PGI-11},
      cid          = {I:(DE-Juel1)PGI-11-20170113},
      pnm          = {5221 - Advanced Solid-State Qubits and Qubit Systems
                      (POF4-522)},
      pid          = {G:(DE-HGF)POF4-5221},
      typ          = {PUB:(DE-HGF)8},
      doi          = {https://doi.org/10.1109/IEDM50572.2025.11353490},
      url          = {https://juser.fz-juelich.de/record/1054014},
}