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| Hauptseite > Publikationsdatenbank > High-fidelity single-electron shuttling in industrially fabricated spin qubit devices > print |
| Hauptseite > Publikationsdatenbank > High-fidelity single-electron shuttling in industrially fabricated spin qubit devices > print |
| 001 | 1054014 | ||
| 005 | 20260203202228.0 | ||
| 024 | 7 | _ | |a 10.1109/IEDM50572.2025.11353490 |2 doi |
| 024 | 7 | _ | |a https://doi.org/10.1109/IEDM50572.2025.11353490 |2 doi |
| 037 | _ | _ | |a FZJ-2026-01668 |
| 100 | 1 | _ | |a Muster, P. |0 P:(DE-HGF)0 |b 0 |
| 111 | 2 | _ | |a 2025 IEEE International Electron Devices Meeting (IEDM) |c San Francisco |d 2025-12-06 - 2025-12-10 |w CA |
| 245 | _ | _ | |a High-fidelity single-electron shuttling in industrially fabricated spin qubit devices |
| 260 | _ | _ | |c 2025 |b IEEE |
| 300 | _ | _ | |a 111 |
| 336 | 7 | _ | |a CONFERENCE_PAPER |2 ORCID |
| 336 | 7 | _ | |a Conference Paper |0 33 |2 EndNote |
| 336 | 7 | _ | |a INPROCEEDINGS |2 BibTeX |
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| 336 | 7 | _ | |a Output Types/Conference Paper |2 DataCite |
| 336 | 7 | _ | |a Contribution to a conference proceedings |b contrib |m contrib |0 PUB:(DE-HGF)8 |s 1770119718_6869 |2 PUB:(DE-HGF) |
| 536 | _ | _ | |a 5221 - Advanced Solid-State Qubits and Qubit Systems (POF4-522) |0 G:(DE-HGF)POF4-5221 |c POF4-522 |f POF IV |x 0 |
| 588 | _ | _ | |a Dataset connected to CrossRef Conference |
| 700 | 1 | _ | |a Langheinrich, W. |0 P:(DE-HGF)0 |b 1 |
| 700 | 1 | _ | |a Huckemann, T. |0 P:(DE-Juel1)180702 |b 2 |e Corresponding author |
| 700 | 1 | _ | |a Pregl, S. |0 P:(DE-HGF)0 |b 3 |
| 700 | 1 | _ | |a Brackmann, V. |0 P:(DE-HGF)0 |b 4 |
| 700 | 1 | _ | |a Friedrich, M. |0 P:(DE-HGF)0 |b 5 |
| 700 | 1 | _ | |a Reichmann, F. |0 P:(DE-HGF)0 |b 6 |
| 700 | 1 | _ | |a Komerički, N. D. |0 P:(DE-HGF)0 |b 7 |
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| 700 | 1 | _ | |a Bluhm, H. |0 P:(DE-Juel1)172019 |b 9 |u fzj |
| 773 | _ | _ | |a https://doi.org/10.1109/IEDM50572.2025.11353490 |
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