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| Hauptseite > Publikationsdatenbank > A Framework for Consistent Measurement Workflows across IC Development, Verification and Data Management > print |
| Hauptseite > Publikationsdatenbank > A Framework for Consistent Measurement Workflows across IC Development, Verification and Data Management > print |
| 001 | 1055113 | ||
| 005 | 20260226202508.0 | ||
| 024 | 7 | _ | |a 10.34734/FZJ-2026-01870 |2 datacite_doi |
| 037 | _ | _ | |a FZJ-2026-01870 |
| 041 | _ | _ | |a English |
| 100 | 1 | _ | |a Schnorrenberg, Klara |0 P:(DE-Juel1)176539 |b 0 |e Corresponding author |
| 111 | 2 | _ | |a deRSE26 - 6th conference for Research Software Engineering & 1st Stuttgart Research Software Day |g deRSE26 |c Stuttgart |d 2026-03-02 - 2026-03-05 |w Germany |
| 245 | _ | _ | |a A Framework for Consistent Measurement Workflows across IC Development, Verification and Data Management |
| 260 | _ | _ | |c 2026 |
| 336 | 7 | _ | |a Conference Paper |0 33 |2 EndNote |
| 336 | 7 | _ | |a INPROCEEDINGS |2 BibTeX |
| 336 | 7 | _ | |a conferenceObject |2 DRIVER |
| 336 | 7 | _ | |a CONFERENCE_POSTER |2 ORCID |
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| 336 | 7 | _ | |a Poster |b poster |m poster |0 PUB:(DE-HGF)24 |s 1772115091_26454 |2 PUB:(DE-HGF) |x Other |
| 520 | _ | _ | |a Modern research laboratories rely on complex measurement infrastructures that integrate a wide range of devices and interfaces.Traditional laboratory processes are often manual and decentralized, leading to errors and increased workload.This project presents a framework that orchestrates the integrated circuits (IC) and laboratory infrastructure used for qubit measurements. It also includes tools for measurement analysis. The framework covers the complete workflow from IC design to experimental validation, utilizing a centralized dataset to prevent inconsistencies while reducing communication overhead throughout all development stages.The framework consists of several components.One component is a central Data Management Software that enables structured storage of device and laboratory information. It supports the creation of measurement setups and calibration procedures, making them traceable and improving quality management.The Measurement Device Driver abstracts SCPI commands (Standard Commands for Programmable Instruments), offering the option of using a general command in measurement scripts. These then execute the device-specific SCPI commands in the background. This means that the measurement script no longer needs to be changed with regard to the SCPI commands when the devices are replaced with a different model or manufacturer.The control of the measurement devices is complemented by an interface for operating ICs via JTAG. To ensure efficient and consistent verification, relevant register and routine information used in test cases are stored in the central database. This enables digital and analog designers as well as verification engineers to access the same data throughout the entire workflow, from pre- to post-silicon verification.The system also includes a synchronization module that provides deterministic timing signals to synchronize measurement equipment and the device under test. It analyzes VCD files exported from digital simulations to detect periodic behavior and derive configuration values. These waveforms are then replayed in real time via FPGA or AWG, enabling direct comparison between simulation and hardware. Using the same dataset ensures consistency while preventing errors.This setup has been used successfully in chip development for a readout of semiconductor quantum dots.Furthermore, the framework supports the definition of measurement routines as reusable shared libraries that can be executed independently of programming languages. The automation of measurement routines achieves consistent and reproducible results, enabling efficient error analysis and correction.In a future version, the recorded measurement data will also be stored in a central database, automatically processing them according to the FAIR principles.The poster presents the current and future components of our framework and shows how they will work together to improve workflows from IC design to qubit measurement. |
| 536 | _ | _ | |a 5223 - Quantum-Computer Control Systems and Cryoelectronics (POF4-522) |0 G:(DE-HGF)POF4-5223 |c POF4-522 |f POF IV |x 0 |
| 700 | 1 | _ | |a Kessel, Daniel |0 P:(DE-Juel1)179332 |b 1 |e Corresponding author |u fzj |
| 700 | 1 | _ | |a Bühler, Jonas |0 P:(DE-Juel1)187429 |b 2 |
| 700 | 1 | _ | |a Eguzo, Chimezie Vincent |0 P:(DE-Juel1)180232 |b 3 |
| 700 | 1 | _ | |a Fleitmann, Sarah |0 P:(DE-Juel1)173094 |b 4 |
| 700 | 1 | _ | |a Krenz, Eric |0 P:(DE-Juel1)194691 |b 5 |
| 700 | 1 | _ | |a Papajewski, Benjamin |0 P:(DE-Juel1)179333 |b 6 |
| 700 | 1 | _ | |a Aksoy, Alperen |0 P:(DE-Juel1)194719 |b 7 |
| 700 | 1 | _ | |a Fuchs, Fabian |0 P:(DE-Juel1)176540 |b 8 |
| 700 | 1 | _ | |a Gedikli, Tuba Neda |0 P:(DE-Juel1)206617 |b 9 |
| 700 | 1 | _ | |a Thünker, Lea Marie |0 P:(DE-Juel1)201174 |b 10 |
| 700 | 1 | _ | |a Reitz, Janis Philip |0 P:(DE-Juel1)201175 |b 11 |
| 700 | 1 | _ | |a Harff, Markus |0 P:(DE-Juel1)164820 |b 12 |
| 700 | 1 | _ | |a Meyer, Stefanie |0 P:(DE-Juel1)7756 |b 13 |
| 700 | 1 | _ | |a Robens, Markus |0 P:(DE-Juel1)156319 |b 14 |
| 700 | 1 | _ | |a van Waasen, Stefan |0 P:(DE-Juel1)142562 |b 15 |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/1055113/files/Poster_deRSE26_Schnorrenberg_Ke%C3%9Fel.pdf |y OpenAccess |
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