Poster (After Call) FZJ-2026-04967

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Denoising Strategy for VCM-based ReRAM Devices

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2026

European Symp. on Reliability of Electron Devices, Failure Physics and Analysis, ESREF, ViennaVienna, Austria, 21 Sep 2026 - 24 Sep 20262026-09-212026-09-24


Contributing Institute(s):
  1. Elektronische Materialien (PGI-7)
  2. JARA-FIT (JARA-FIT)
Research Program(s):
  1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)
  2. BMFTR 03ZU2106AA - NeuroSys: KI-anwendungsspezifische Technologiereifung memristiver Bauteile (Projekt A) - Teilvorhaben A (03ZU2106AA) (03ZU2106AA)
  3. BMFTR 03ZU2106AB - NeuroSys: KI-anwendungsspezifische Technologiereifung memristiver Bauteile (Projekt A) - Teilvorhaben B (03ZU2106AB) (03ZU2106AB)

Appears in the scientific report 2026
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The record appears in these collections:
JARA > JARA > JARA-JARA\-FIT
Document types > Presentations > Poster
Institute Collections > PGI > PGI-7
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 Record created 2026-10-12, last modified 2026-10-12



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