%0 Journal Article
%A Weides, M.
%A Peralagu, U.
%A Kohlstedt, H.
%A Pfeifer, J.
%A Kemmler, M.
%A Gürlich, C.
%A Goldobin, E.
%A Koelle, D.
%A Kleiner, R.
%T Critical current diffraction pattern of SIFS Josephson junctions with a step-like F-layer
%J Superconductor science and technology
%V 23
%@ 0953-2048
%C Bristol
%I IOP Publ.
%M PreJuSER-10832
%P 095007
%D 2010
%Z Support via DFG (SFB/TRR-21, WE 4359/1-1) and the AvH Foundation (MW) is gratefully acknowledged.
%X We present the latest generation of superconductor-insulator-ferromagnet-superconductor Josephson tunnel junctions with a step-like thickness of the ferromagnetic (F) layer. The F-layer thicknesses d(1) and d(2) in both halves were varied to obtain different combinations of positive and negative critical current densities j(c), 1 and j(c), 2. The measured dependences of the critical current on applied magnetic field can be well described by a model which takes into account different critical current densities (obtained from reference junctions) and different net magnetization of the multidomain ferromagnetic layer in both halves.
%K J (WoSType)
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000280963500008
%R 10.1088/0953-2048/23/9/095007
%U https://juser.fz-juelich.de/record/10832