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| Hauptseite > Publikationsdatenbank > Critical current diffraction pattern of SIFS Josephson junctions with a step-like F-layer > print |
| Hauptseite > Publikationsdatenbank > Critical current diffraction pattern of SIFS Josephson junctions with a step-like F-layer > print |
| 001 | 10832 | ||
| 005 | 20180208203333.0 | ||
| 024 | 7 | _ | |2 DOI |a 10.1088/0953-2048/23/9/095007 |
| 024 | 7 | _ | |2 WOS |a WOS:000280963500008 |
| 037 | _ | _ | |a PreJuSER-10832 |
| 041 | _ | _ | |a eng |
| 082 | _ | _ | |a 530 |
| 084 | _ | _ | |2 WoS |a Physics, Applied |
| 084 | _ | _ | |2 WoS |a Physics, Condensed Matter |
| 100 | 1 | _ | |0 P:(DE-Juel1)VDB59925 |a Weides, M. |b 0 |u FZJ |
| 245 | _ | _ | |a Critical current diffraction pattern of SIFS Josephson junctions with a step-like F-layer |
| 260 | _ | _ | |a Bristol |b IOP Publ. |c 2010 |
| 300 | _ | _ | |a 095007 |
| 336 | 7 | _ | |a Journal Article |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |
| 336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
| 336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
| 336 | 7 | _ | |a ARTICLE |2 BibTeX |
| 336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
| 336 | 7 | _ | |a article |2 DRIVER |
| 440 | _ | 0 | |0 5665 |a Superconductor Science and Technology |v 23 |x 0953-2048 |y 9 |
| 500 | _ | _ | |a Support via DFG (SFB/TRR-21, WE 4359/1-1) and the AvH Foundation (MW) is gratefully acknowledged. |
| 520 | _ | _ | |a We present the latest generation of superconductor-insulator-ferromagnet-superconductor Josephson tunnel junctions with a step-like thickness of the ferromagnetic (F) layer. The F-layer thicknesses d(1) and d(2) in both halves were varied to obtain different combinations of positive and negative critical current densities j(c), 1 and j(c), 2. The measured dependences of the critical current on applied magnetic field can be well described by a model which takes into account different critical current densities (obtained from reference junctions) and different net magnetization of the multidomain ferromagnetic layer in both halves. |
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| 588 | _ | _ | |a Dataset connected to Web of Science |
| 650 | _ | 7 | |2 WoSType |a J |
| 700 | 1 | _ | |0 P:(DE-HGF)0 |a Peralagu, U. |b 1 |
| 700 | 1 | _ | |0 P:(DE-Juel1)VDB3107 |a Kohlstedt, H. |b 2 |u FZJ |
| 700 | 1 | _ | |0 P:(DE-HGF)0 |a Pfeifer, J. |b 3 |
| 700 | 1 | _ | |0 P:(DE-HGF)0 |a Kemmler, M. |b 4 |
| 700 | 1 | _ | |0 P:(DE-HGF)0 |a Gürlich, C. |b 5 |
| 700 | 1 | _ | |0 P:(DE-HGF)0 |a Goldobin, E. |b 6 |
| 700 | 1 | _ | |0 P:(DE-HGF)0 |a Koelle, D. |b 7 |
| 700 | 1 | _ | |0 P:(DE-HGF)0 |a Kleiner, R. |b 8 |
| 773 | _ | _ | |0 PERI:(DE-600)1361475-7 |a 10.1088/0953-2048/23/9/095007 |g Vol. 23, p. 095007 |p 095007 |q 23<095007 |t Superconductor science and technology |v 23 |x 0953-2048 |y 2010 |
| 856 | 7 | _ | |u http://dx.doi.org/10.1088/0953-2048/23/9/095007 |
| 909 | C | O | |o oai:juser.fz-juelich.de:10832 |p VDB |
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| 914 | 1 | _ | |y 2010 |
| 915 | _ | _ | |0 StatID:(DE-HGF)0010 |a JCR/ISI refereed |
| 915 | _ | _ | |0 StatID:(DE-HGF)0020 |a No peer review |
| 920 | 1 | _ | |d 31.12.2010 |g IFF |k IFF-6 |l Elektronische Materialien |0 I:(DE-Juel1)VDB786 |x 0 |
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