Hauptseite > Publikationsdatenbank > Imaging Pauli Repulsion in Scanning Tunneling Microscopy > print

001     10970
005     20200423202814.0
024 7 _ |2 DOI
|a 10.1103/PhysRevLett.105.086103
024 7 _ |2 WOS
|a WOS:000281072100012
024 7 _ |2 Handle
|a 2128/7251
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037 _ _ |a PreJuSER-10970
041 _ _ |a eng
082 _ _ |a 550
084 _ _ |2 WoS
|a Physics, Multidisciplinary
100 1 _ |0 P:(DE-Juel1)VDB85047
|a Weiss, C.
|b 0
|u FZJ
245 _ _ |a Imaging Pauli Repulsion in Scanning Tunneling Microscopy
260 _ _ |a College Park, Md.
|b APS
|c 2010
300 _ _ |a 086103
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|a Journal Article
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|a article
440 _ 0 |0 4925
|a Physical Review Letters
|v 105
|x 0031-9007
|y 8
500 _ _ |a Financial support from the Helmholtz Gemeinschaft is gratefully acknowledged, as are helpful discussions with J. Kroha (Bonn), S. Blugel and N. Atodiresei (Julich).
520 _ _ |a A scanning tunneling microscope (STM) has been equipped with a nanoscale force sensor and signal transducer composed of a single D2 molecule that is confined in the STM junction. The uncalibrated sensor is used to obtain ultrahigh geometric image resolution of a complex organic molecule adsorbed on a noble metal surface. By means of conductance-distance spectroscopy and corresponding density functional calculations the mechanism of the sensor and transducer is identified. It probes the short-range Pauli repulsion and converts this signal into variations of the junction conductance.
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700 1 _ |0 P:(DE-Juel1)VDB82898
|a Wagner, C.
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700 1 _ |0 P:(DE-Juel1)VDB93050
|a Kleimann, C.
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700 1 _ |0 P:(DE-HGF)0
|a Rohlfing, M.
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700 1 _ |0 P:(DE-Juel1)128791
|a Tautz, F. S.
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700 1 _ |0 P:(DE-Juel1)VDB73384
|a Temirov, R.
|b 5
|u FZJ
773 _ _ |0 PERI:(DE-600)1472655-5
|a 10.1103/PhysRevLett.105.086103
|g Vol. 105, p. 086103
|p 086103
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|t Physical review letters
|v 105
|x 0031-9007
|y 2010
856 7 _ |u http://dx.doi.org/10.1103/PhysRevLett.105.086103
856 4 _ |u https://juser.fz-juelich.de/record/10970/files/FZJ-10970.pdf
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914 1 _ |y 2010
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