% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Schulte:11443,
      author       = {Schulte, M. and Bittkau, K. and Pieters, B. P. and Jorke,
                      S. and Stiebig, H. and Hüpkes, J. and Rau, U.},
      title        = {{R}ay tracing analysis of light scattering properties of
                      randomly nano-textured {Z}n{O} films},
      journal      = {SPIE newsroom},
      volume       = {7717},
      issn         = {1818-2259},
      reportid     = {PreJuSER-11443},
      pages        = {77170N},
      year         = {2010},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {We investigate the scattering behavior of nano-textured
                      ZnO-Air and ZnO-Silicon interfaces for the application in
                      thin film silicon solar cells. Contrary to the common
                      approach, the numerical solution of the Maxwell's equations,
                      we introduce a ray tracing approach based on geometric
                      optics and the measured interface topography. The validity
                      of this model is discussed by means of SNOM measurements and
                      numerical solutions of the Maxwell's equations. We show,
                      that the ray tracing model can qualitatively describe the
                      formation of micro lenses, which are the dominant feature of
                      the local scattering properties of the investigated
                      interfaces. A quantitative analysis for the ZnO-Silicon
                      interface at lambda=488 nm shows that the ray tracing model
                      corresponds well to the numerical solution of the Maxwell's
                      equations. At lambda=780 nm, a good agreement up to distance
                      of approximately 1.5 mu m from the topography minimum is
                      achieved. The reduced effective wavelength in silicon leads
                      to a better description of the ZnO-Silicon interface with
                      respect to the ZnO-Air interface by the ray tracing model.},
      keywords     = {Adult / Female / Hepatitis B, Chronic: complications /
                      Humans / Interleukin 1 Receptor Antagonist Protein: genetics
                      / Interleukin-10: genetics / Interleukin-1beta: genetics /
                      Liver Cirrhosis: complications / Liver Cirrhosis: genetics /
                      Male / Polymorphism, Genetic / Tumor Necrosis Factor-alpha:
                      genetics / IL1RN protein, human (NLM Chemicals) /
                      Interleukin 1 Receptor Antagonist Protein (NLM Chemicals) /
                      Interleukin-1beta (NLM Chemicals) / Tumor Necrosis
                      Factor-alpha (NLM Chemicals) / Interleukin-10 (NLM
                      Chemicals)},
      cin          = {IEF-5},
      cid          = {I:(DE-Juel1)VDB813},
      pnm          = {Erneuerbare Energien},
      pid          = {G:(DE-Juel1)FUEK401},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {pmid:17645476},
      UT           = {WOS:000285181500018},
      doi          = {10.1117/12.854560},
      url          = {https://juser.fz-juelich.de/record/11443},
}