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| Hauptseite > Publikationsdatenbank > Extrinsic screening of ferroelectric domains in Pb(Zr0.48Ti0.52)O3 > print |
| Hauptseite > Publikationsdatenbank > Extrinsic screening of ferroelectric domains in Pb(Zr0.48Ti0.52)O3 > print |
| 001 | 12552 | ||
| 005 | 20200423202851.0 | ||
| 024 | 7 | _ | |a 10.1063/1.3523359 |2 DOI |
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| 084 | _ | _ | |2 WoS |a Physics, Applied |
| 100 | 1 | _ | |a Krug, I. |b 0 |u FZJ |0 P:(DE-Juel1)VDB43743 |
| 245 | _ | _ | |a Extrinsic screening of ferroelectric domains in Pb(Zr0.48Ti0.52)O3 |
| 260 | _ | _ | |a Melville, NY |b American Institute of Physics |c 2010 |
| 300 | _ | _ | |a 222903 |
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| 440 | _ | 0 | |a Applied Physics Letters |x 0003-6951 |0 562 |y 22 |v 97 |
| 500 | _ | _ | |a Record converted from VDB: 12.11.2012 |
| 520 | _ | _ | |a The variation in the surface potential as a function of the ferroelectric polarization of micron scale domains in a thin epitaxial film of Pb(Zr0.48Ti0.52)O-3 is measured using mirror electron microscopy. Domains were written using piezoforce microscopy. The surface potential for each polarization was deduced from the mirror to low energy electron microscopy transition in the local reflectivity curve. The effect of extrinsic screening of the fixed polarization charge at the ferroelectric surface is demonstrated. The results are compared with density functional theory calculations. (C) 2010 American Institute of Physics. [doi:10.1063/1.3523359] |
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| 856 | 7 | _ | |u http://dx.doi.org/10.1063/1.3523359 |
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