TY  - JOUR
AU  - Simon, Ronnie
AU  - Vianden, Reiner
AU  - Köhler, Klaus
TI  - Implantation Studies on Silicon-Doped GaN
JO  - Journal of electronic materials
VL  - 42
IS  - 1
CY  - Warrendale, Pa
PB  - TMS
M1  - FZJ-2012-00509
SP  - 21-25
PY  - 2013
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000312660100004
DO  - DOI:10.1007/s11664-012-2278-0
UR  - https://juser.fz-juelich.de/record/127549
ER  -