%0 Conference Paper
%A Schmidt, A.
%A Bürger, A.
%A Dominiczak, K.
%A Keusemann, S.
%A Löwenhoff, T.
%A Linke, J.
%A Rödig, M.
%A Thomser, C.
%T High Heat Flux Testing of Components for Future Devices by Means of the Facility JUDITH 2
%M PreJuSER-12779
%D 2010
%Z Record converted from VDB: 12.11.2012
%< EBEAM 2010
Y2 24 Oct 2010
M2 Reno, USA, 
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/12779