TY  - CONF
AU  - Nöldgen, Holger
AU  - Streun, Matthias
AU  - Kemmerling, Günter
AU  - van Waasen, Stefan
TI  - Temperature dependency of digital SiPMs
M1  - FZJ-2013-00977
PY  - 2012
AB  - During the last years a new device for photon detection has been developed by Philips Digital Photon Counting, combining Silicon-PMT techniques with integrated logic, to get a fully digital photo sensor (dSiPM). An Evaluation Kit for dSiPMs has been installed at the Central Institute for Electronics at the Forschungszentrum Jülich. First measurements show, that the chip temperature is a factor that has to be controlled by the operator, since the higher integrated electronics on the die heat up the sensor. In this work, we present our first results focusing the influence of the temperature on the digital SiPMs. A test setup with a high power Peltier element has been set up to cool down the sensor device below -10°C. Several measurements have been done with the dSiPM evaluation kit to show the behaviour of the breakdown-voltage and the dark count rate under different temperature conditions.
T2  - Workshop: Tomography, data processing and image reconstruction for medicine and engineering
CY  - 10 Sep 2012 - 12 Sep 2012, Dresden (Germany)
Y2  - 10 Sep 2012 - 12 Sep 2012
M2  - Dresden, Germany
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/130748
ER  -