000133205 001__ 133205
000133205 005__ 20210129211433.0
000133205 0247_ $$2doi$$a10.1063/1.4792509
000133205 0247_ $$2ISSN$$a1077-3118
000133205 0247_ $$2ISSN$$a0003-6951
000133205 0247_ $$2WOS$$aWOS:000315596700008
000133205 0247_ $$2Handle$$a2128/5063
000133205 037__ $$aFZJ-2013-01743
000133205 082__ $$a530
000133205 1001_ $$0P:(DE-Juel1)130677$$aGunkel, F.$$b0$$eCorresponding author$$ufzj
000133205 245__ $$aStoichiometry dependence and thermal stability of conducting NdGaO3/SrTiO3 heterointerfaces
000133205 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2013
000133205 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s133205
000133205 3367_ $$2DataCite$$aOutput Types/Journal article
000133205 3367_ $$00$$2EndNote$$aJournal Article
000133205 3367_ $$2BibTeX$$aARTICLE
000133205 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000133205 3367_ $$2DRIVER$$aarticle
000133205 500__ $$3POF3_Assignment on 2016-02-29
000133205 536__ $$0G:(DE-HGF)POF2-421$$a421 - Frontiers of charge based Electronics (POF2-421)$$cPOF2-421$$fPOF II$$x0
000133205 588__ $$aDataset connected to CrossRef, juser.fz-juelich.de
000133205 7001_ $$0P:(DE-Juel1)145428$$aSkaja, K.$$b1$$ufzj
000133205 7001_ $$0P:(DE-Juel1)145072$$aShkabko, A.$$b2$$ufzj
000133205 7001_ $$0P:(DE-Juel1)130620$$aDittmann, R.$$b3$$ufzj
000133205 7001_ $$0P:(DE-Juel1)130717$$aHoffmann-Eifert, S.$$b4$$ufzj
000133205 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b5$$ufzj
000133205 773__ $$0PERI:(DE-600)1469436-0$$a10.1063/1.4792509$$gVol. 102, no. 7, p. 071601 -$$n7$$p071601$$tApplied physics letters$$v102$$x0003-6951$$y2013
000133205 8564_ $$yPublished under German "Allianz" Licensing conditions on 2013-02-19. Available in OpenAccess from 2013-02-19$$zPublished final document.
000133205 8564_ $$uhttps://juser.fz-juelich.de/record/133205/files/FZJ-133205.pdf$$yPublished under German "Allianz" Licensing conditions on 2013-02-19. Available in OpenAccess from 2013-02-19$$zPublished final document.
000133205 8564_ $$uhttps://juser.fz-juelich.de/record/133205/files/FZJ-133205.jpg?subformat=icon-1440$$xicon-1440
000133205 8564_ $$uhttps://juser.fz-juelich.de/record/133205/files/FZJ-133205.jpg?subformat=icon-180$$xicon-180
000133205 8564_ $$uhttps://juser.fz-juelich.de/record/133205/files/FZJ-133205.jpg?subformat=icon-640$$xicon-640
000133205 909CO $$ooai:juser.fz-juelich.de:133205$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire
000133205 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130677$$aForschungszentrum Jülich GmbH$$b0$$kFZJ
000133205 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)145428$$aForschungszentrum Jülich GmbH$$b1$$kFZJ
000133205 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)145072$$aForschungszentrum Jülich GmbH$$b2$$kFZJ
000133205 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130620$$aForschungszentrum Jülich GmbH$$b3$$kFZJ
000133205 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130717$$aForschungszentrum Jülich GmbH$$b4$$kFZJ
000133205 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131022$$aForschungszentrum Jülich GmbH$$b5$$kFZJ
000133205 9132_ $$0G:(DE-HGF)POF3-529H$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vAddenda$$x0
000133205 9131_ $$0G:(DE-HGF)POF2-421$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vFrontiers of charge based Electronics$$x0
000133205 9141_ $$y2013
000133205 915__ $$0StatID:(DE-HGF)0010$$2StatID$$aJCR/ISI refereed
000133205 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000133205 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000133205 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000133205 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000133205 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000133205 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000133205 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000133205 915__ $$0StatID:(DE-HGF)0400$$2StatID$$aAllianz-Lizenz / DFG
000133205 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000133205 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000133205 915__ $$0StatID:(DE-HGF)0520$$2StatID$$aAllianz-OA
000133205 915__ $$0StatID:(DE-HGF)1020$$2StatID$$aDBCoverage$$bCurrent Contents - Social and Behavioral Sciences
000133205 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000133205 980__ $$ajournal
000133205 980__ $$aUNRESTRICTED
000133205 980__ $$aJUWEL
000133205 980__ $$aFullTexts
000133205 980__ $$aI:(DE-Juel1)PGI-7-20110106
000133205 980__ $$aVDB
000133205 9801_ $$aFullTexts