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@ARTICLE{Jia:133403,
      author       = {Jia, Chun-Lin and Barthel, Juri and Gunkel, Felix and
                      Dittmann, Regina and Hoffmann-Eifert, Susanne and Houben,
                      Lothar and Lentzen, M. and Thust, Andreas},
      title        = {{A}tomic-scale measurement of structure and chemistry of a
                      single-unit-cell layer of {L}a{A}l{O}3 embedded in
                      {S}r{T}i{O}3},
      journal      = {Microscopy and microanalysis},
      volume       = {19},
      number       = {2},
      issn         = {1431-9276},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2013-01862},
      pages        = {310-318},
      year         = {2013},
      abstract     = {A single layer of LaAlO3 with a nominal thickness of one
                      unit cell, which is sandwiched between a SrTiO3 substrate
                      and a SrTiO3 capping layer, is quantitatively investigated
                      by high-resolution transmission electron microscopy. By the
                      use of an aberration-corrected electron microscope and by
                      employing sophisticated numerical image simulation
                      procedures, significant progress is made in two aspects.
                      First, the structural as well as the chemical features of
                      the interface are determined simultaneously on an atomic
                      scale from the same specimen area. Second, the evaluation of
                      the structural and chemical data is carried out in a fully
                      quantitative way on the basis of the absolute image
                      contrast, which has not been achieved so far in materials
                      science investigations using high-resolution electron
                      microscopy. Considering the strong influence of even subtle
                      structural details on the electronic properties of
                      interfaces in oxide materials, a fully quantitative
                      interface analysis, which makes positional data available
                      with picometer precision together with the related chemical
                      information, can contribute to a better understanding of the
                      functionality of such interfaces.},
      cin          = {PGI-7 / PGI-5},
      ddc          = {570},
      cid          = {I:(DE-Juel1)PGI-7-20110106 / I:(DE-Juel1)PGI-5-20110106},
      pnm          = {424 - Exploratory materials and phenomena (POF2-424)},
      pid          = {G:(DE-HGF)POF2-424},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000316221500007},
      doi          = {10.1017/S1431927612014407},
      url          = {https://juser.fz-juelich.de/record/133403},
}