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@ARTICLE{Keeble:134331,
author = {Keeble, D. J. and Wicklein, S. and Jin, L. and Jia, C. L.
and Egger, W. and Dittmann, R.},
title = {{N}onstoichiometry accommodation in ${S}r{T}i{O}_{3}$ thin
films studied by positron annihilation and electron
microscopy},
journal = {Physical review / B},
volume = {87},
number = {19},
issn = {1098-0121},
address = {College Park, Md.},
publisher = {APS},
reportid = {FZJ-2013-02558},
pages = {195409},
year = {2013},
cin = {PGI-7 / PGI-5 / ICS-8},
ddc = {530},
cid = {I:(DE-Juel1)PGI-7-20110106 / I:(DE-Juel1)PGI-5-20110106 /
I:(DE-Juel1)ICS-8-20110106},
pnm = {421 - Frontiers of charge based Electronics (POF2-421)},
pid = {G:(DE-HGF)POF2-421},
experiment = {EXP:(DE-MLZ)NEPOMUC-20140101},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000318687300007},
doi = {10.1103/PhysRevB.87.195409},
url = {https://juser.fz-juelich.de/record/134331},
}