000135155 001__ 135155
000135155 005__ 20240610120559.0
000135155 0247_ $$2doi$$a10.1002/pssa.201228217
000135155 0247_ $$2ISSN$$a1862-6319
000135155 0247_ $$2ISSN$$a0031-8965
000135155 0247_ $$2ISSN$$a1862-6300
000135155 0247_ $$2ISSN$$a1521-396X
000135155 0247_ $$2WOS$$aWOS:000315269800001
000135155 0247_ $$2altmetric$$aaltmetric:1085658
000135155 037__ $$aFZJ-2013-03122
000135155 082__ $$a530
000135155 1001_ $$0P:(DE-HGF)0$$aMłynarczyk, Marcin$$b0$$eCorresponding author
000135155 245__ $$aStructural stratification of Sr 1 − x Ca x RuO 3 thin films: Influence of aging process
000135155 260__ $$aWeinheim$$bWiley-VCH$$c2013
000135155 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1373635550_19175
000135155 3367_ $$2DataCite$$aOutput Types/Journal article
000135155 3367_ $$00$$2EndNote$$aJournal Article
000135155 3367_ $$2BibTeX$$aARTICLE
000135155 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000135155 3367_ $$2DRIVER$$aarticle
000135155 500__ $$3POF3_Assignment on 2016-02-29
000135155 536__ $$0G:(DE-HGF)POF2-421$$a421 - Frontiers of charge based Electronics (POF2-421)$$cPOF2-421$$fPOF II$$x0
000135155 588__ $$aDataset connected to CrossRef, juser.fz-juelich.de
000135155 7001_ $$0P:(DE-HGF)0$$aSzot, Krzysztof$$b1
000135155 7001_ $$0P:(DE-HGF)0$$aPoppe, Ulrich$$b2
000135155 7001_ $$0P:(DE-Juel1)133840$$aBreuer, Uwe$$b3$$ufzj
000135155 7001_ $$0P:(DE-HGF)0$$aMi, Shaobo$$b4
000135155 7001_ $$0P:(DE-HGF)0$$aPsiuk, Bronisław$$b5
000135155 7001_ $$0P:(DE-HGF)0$$aGörlich, Edward A.$$b6
000135155 7001_ $$0P:(DE-HGF)0$$aTomala, Krzysztof$$b7
000135155 7001_ $$0P:(DE-HGF)0$$aWaser, Rainer$$b8
000135155 773__ $$0PERI:(DE-600)1481091-8$$a10.1002/pssa.201228217$$gVol. 210, no. 2, p. 239 - 254$$n2$$p239 - 254$$tPhysica status solidi / A$$v210$$x1862-6300$$y2013
000135155 8564_ $$uhttps://juser.fz-juelich.de/record/135155/files/FZJ-2013-03122.pdf$$yRestricted$$zPublished final document.
000135155 909CO $$ooai:juser.fz-juelich.de:135155$$pVDB
000135155 9101_ $$0I:(DE-Juel1)ZEA-3-20090406$$6P:(DE-Juel1)133840$$aAnalytik$$b3$$kZEA-3
000135155 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)133840$$aForschungszentrum Jülich GmbH$$b3$$kFZJ
000135155 9132_ $$0G:(DE-HGF)POF3-529H$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vAddenda$$x0
000135155 9131_ $$0G:(DE-HGF)POF2-421$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vFrontiers of charge based Electronics$$x0
000135155 9141_ $$y2013
000135155 915__ $$0StatID:(DE-HGF)0010$$2StatID$$aJCR/ISI refereed
000135155 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000135155 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000135155 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000135155 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000135155 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000135155 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000135155 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000135155 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000135155 915__ $$0StatID:(DE-HGF)1040$$2StatID$$aDBCoverage$$bZoological Record
000135155 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000135155 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x1
000135155 9201_ $$0I:(DE-Juel1)ZEA-3-20090406$$kZEA-3$$lAnalytik$$x2
000135155 980__ $$ajournal
000135155 980__ $$aVDB
000135155 980__ $$aUNRESTRICTED
000135155 980__ $$aI:(DE-Juel1)PGI-7-20110106
000135155 980__ $$aI:(DE-Juel1)PGI-5-20110106
000135155 980__ $$aI:(DE-Juel1)ZEA-3-20090406
000135155 981__ $$aI:(DE-Juel1)ER-C-1-20170209
000135155 981__ $$aI:(DE-Juel1)PGI-5-20110106
000135155 981__ $$aI:(DE-Juel1)ZEA-3-20090406