Contribution to a conference proceedings

FZJ-2013-03126

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Near-Field Study of Spatially Resolved Light Scattering in Thin-Film Silicon Solar Cells

Bittkau, K. (Corresponding author)FZJ* ; Beckers, T. ; Carius, R.FZJ*

2010

ISBN: 3-936338-26-4

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Please use a persistent id in citations: doi:10.4229/25thEUPVSEC2010-3AV.1.40

Abstract: A method to extract spatially and angularly resolved light scattering in thin-film solar cells from near-field scanning optical microscopy (NSOM) images is developed which applies Fourier band-pass filters to the experimentally obtained near-field images. The analysis allows the identification of individual surface structures of randomly textured interfaces which provide high light trapping potential. It will be shown that the local light scattering properties and, thus, the light trapping strongly differ on a microscopic scale. The visualization of local light trapping efficiency by NSOM is demonstrated in a thin-film silicon solar cell.

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Contributing Institute(s):

1. Photovoltaik (IEK-5)

Research Program(s):

1. 111 - Thin Film Photovoltaics (POF2-111) (POF2-111)

Appears in the scientific report 2013

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