000135187 001__ 135187
000135187 005__ 20210129211812.0
000135187 0247_ $$2doi$$a10.1063/1.4789944
000135187 0247_ $$2ISSN$$a0021-8979
000135187 0247_ $$2ISSN$$a1089-7550
000135187 0247_ $$2WOS$$aWOS:000314746200045
000135187 0247_ $$2Handle$$a2128/16813
000135187 037__ $$aFZJ-2013-03152
000135187 082__ $$a530
000135187 1001_ $$0P:(DE-HGF)0$$aZurhelle, Alexander$$b0
000135187 245__ $$aResistive switching near electrode interfaces: Estimations by a current model
000135187 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2013
000135187 3367_ $$2DRIVER$$aarticle
000135187 3367_ $$2DataCite$$aOutput Types/Journal article
000135187 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1373988892_32305
000135187 3367_ $$2BibTeX$$aARTICLE
000135187 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000135187 3367_ $$00$$2EndNote$$aJournal Article
000135187 500__ $$3POF3_Assignment on 2016-02-29
000135187 536__ $$0G:(DE-HGF)POF2-421$$a421 - Frontiers of charge based Electronics (POF2-421)$$cPOF2-421$$fPOF II$$x0
000135187 588__ $$aDataset connected to CrossRef, juser.fz-juelich.de
000135187 7001_ $$0P:(DE-HGF)0$$aStemmer, Stefanie$$b1
000135187 7001_ $$0P:(DE-HGF)0$$aMarchewka, Astrid$$b2
000135187 7001_ $$0P:(DE-HGF)0$$aWaser, Rainer$$b3
000135187 7001_ $$0P:(DE-Juel1)130957$$aSchroeder, Herbert$$b4$$eCorresponding author$$ufzj
000135187 773__ $$0PERI:(DE-600)1476463-5$$a10.1063/1.4789944$$gVol. 113, no. 5, p. 053716 -$$n5$$p053716 -$$tJournal of applied physics$$v113$$x0021-8979$$y2013
000135187 8564_ $$uhttps://juser.fz-juelich.de/record/135187/files/FZJ-2013-03152.pdf$$yOpenAccess$$zPublished final document.
000135187 909CO $$ooai:juser.fz-juelich.de:135187$$pdnbdelivery$$pdriver$$pVDB$$popen_access$$popenaire
000135187 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130957$$aForschungszentrum Jülich GmbH$$b4$$kFZJ
000135187 9132_ $$0G:(DE-HGF)POF3-529H$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vAddenda$$x0
000135187 9131_ $$0G:(DE-HGF)POF2-421$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vFrontiers of charge based Electronics$$x0
000135187 9141_ $$y2013
000135187 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000135187 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000135187 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000135187 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000135187 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000135187 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000135187 915__ $$0StatID:(DE-HGF)0010$$2StatID$$aJCR/ISI refereed
000135187 915__ $$0StatID:(DE-HGF)0400$$2StatID$$aAllianz-Lizenz / DFG
000135187 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000135187 915__ $$0StatID:(DE-HGF)1020$$2StatID$$aDBCoverage$$bCurrent Contents - Social and Behavioral Sciences
000135187 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000135187 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000135187 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000135187 980__ $$ajournal
000135187 980__ $$aVDB
000135187 980__ $$aUNRESTRICTED
000135187 980__ $$aI:(DE-Juel1)PGI-7-20110106
000135187 9801_ $$aFullTexts