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000135191 037__ $$aFZJ-2013-03156
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000135191 1001_ $$0P:(DE-Juel1)131014$$aValov, Ilia$$b0$$eCorresponding author
000135191 245__ $$aComment on Real-Time Observation on Dynamic Growth/Dissolution of Conductive Filaments in Oxide-Electrolyte- Based ReRAM
000135191 260__ $$aWeinheim$$bWiley-VCH$$c2013
000135191 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1396508223_15674
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000135191 520__ $$aFilament formation and dissolution in the system Ag(Cu)/ZrO2/Pt were observed by Liu et al. [Adv. Mater. 2012, 24, 1844]. Their explanation of the phenomena is shown here to be inappropriate. Various situations, including the “bipolar electrode” shown in the figure, are considered and the difference between the behavior in electrochemical metallization memories (ECMs) and valence change memories (VCMs) outlined. Of crucial importance for distinguishing ECM from VCM behavior, that is, the effects of cation and anion migration, is the choice of the solid materials used to transport metal cations. A possible explanation of the phenomena is proposed.
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000135191 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b1$$ufzj
000135191 773__ $$0PERI:(DE-600)1474949-x$$a10.1002/adma.201202592$$gVol. 25, no. 2, p. 162 - 164$$n2$$p162 - 164$$tAdvanced materials$$v25$$x0935-9648$$y2013
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