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@ARTICLE{Valov:135191,
author = {Valov, Ilia and Waser, R.},
title = {{C}omment on {R}eal-{T}ime {O}bservation on {D}ynamic
{G}rowth/{D}issolution of {C}onductive {F}ilaments in
{O}xide-{E}lectrolyte- {B}ased {R}e{RAM}},
journal = {Advanced materials},
volume = {25},
number = {2},
issn = {0935-9648},
address = {Weinheim},
publisher = {Wiley-VCH},
reportid = {FZJ-2013-03156},
pages = {162 - 164},
year = {2013},
abstract = {Filament formation and dissolution in the system
Ag(Cu)/ZrO2/Pt were observed by Liu et al. [Adv. Mater.
2012, 24, 1844]. Their explanation of the phenomena is shown
here to be inappropriate. Various situations, including the
“bipolar electrode” shown in the figure, are considered
and the difference between the behavior in electrochemical
metallization memories (ECMs) and valence change memories
(VCMs) outlined. Of crucial importance for distinguishing
ECM from VCM behavior, that is, the effects of cation and
anion migration, is the choice of the solid materials used
to transport metal cations. A possible explanation of the
phenomena is proposed.},
cin = {PGI-7 / JARA-FIT},
ddc = {540},
cid = {I:(DE-Juel1)PGI-7-20110106 / $I:(DE-82)080009_20140620$},
pnm = {421 - Frontiers of charge based Electronics (POF2-421)},
pid = {G:(DE-HGF)POF2-421},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000313262300001},
doi = {10.1002/adma.201202592},
url = {https://juser.fz-juelich.de/record/135191},
}