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@ARTICLE{vandenHurk:135195,
      author       = {van den Hurk, Jan and Valov, Ilia and Waser, R.},
      title        = {{P}reparation and characterization of {G}e{S}x thin-films
                      for resistive switching memories},
      journal      = {Thin solid films},
      volume       = {527},
      issn         = {0040-6090},
      address      = {Amsterdam [u.a.]},
      publisher    = {Elsevier},
      reportid     = {FZJ-2013-03160},
      pages        = {299 - 302},
      year         = {2013},
      cin          = {PGI-7},
      ddc          = {070},
      cid          = {I:(DE-Juel1)PGI-7-20110106},
      pnm          = {421 - Frontiers of charge based Electronics (POF2-421)},
      pid          = {G:(DE-HGF)POF2-421},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000314037200051},
      doi          = {10.1016/j.tsf.2012.12.032},
      url          = {https://juser.fz-juelich.de/record/135195},
}