Hauptseite > Publikationsdatenbank > Molecular dynamics simulations of oxygen vacancy diffusion in SrTiO 3 > print |
001 | 135197 | ||
005 | 20210129211814.0 | ||
024 | 7 | _ | |a 10.1088/0953-8984/24/48/485002 |2 doi |
024 | 7 | _ | |a 1361-648X |2 ISSN |
024 | 7 | _ | |a 0953-8984 |2 ISSN |
024 | 7 | _ | |a WOS:000311105400005 |2 WOS |
037 | _ | _ | |a FZJ-2013-03162 |
082 | _ | _ | |a 530 |
100 | 1 | _ | |a Schie, Marcel |0 P:(DE-HGF)0 |b 0 |e Corresponding author |
245 | _ | _ | |a Molecular dynamics simulations of oxygen vacancy diffusion in SrTiO 3 |
260 | _ | _ | |a Bristol |c 2012 |b IOP Publ. |
336 | 7 | _ | |a article |2 DRIVER |
336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
336 | 7 | _ | |a Journal Article |b journal |m journal |0 PUB:(DE-HGF)16 |s 1581580496_3774 |2 PUB:(DE-HGF) |
336 | 7 | _ | |a ARTICLE |2 BibTeX |
336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
500 | _ | _ | |3 POF3_Assignment on 2016-02-29 |
536 | _ | _ | |a 421 - Frontiers of charge based Electronics (POF2-421) |0 G:(DE-HGF)POF2-421 |c POF2-421 |f POF II |x 0 |
536 | _ | _ | |a Modelling the Valency Change Memory Effect in Resistive Switching Random Access Memory (RRAM) (jpgi70_20120501) |0 G:(DE-Juel1)jpgi70_20120501 |c jpgi70_20120501 |f Modelling the Valency Change Memory Effect in Resistive Switching Random Access Memory (RRAM) |x 1 |
588 | _ | _ | |a Dataset connected to CrossRef, juser.fz-juelich.de |
700 | 1 | _ | |a Marchewka, Astrid |0 P:(DE-HGF)0 |b 1 |
700 | 1 | _ | |a Müller, T. |0 P:(DE-HGF)0 |b 2 |
700 | 1 | _ | |a De Souza, Roger A |0 P:(DE-HGF)0 |b 3 |
700 | 1 | _ | |a Waser, R. |0 P:(DE-Juel1)131022 |b 4 |
773 | _ | _ | |a 10.1088/0953-8984/24/48/485002 |g Vol. 24, no. 48, p. 485002 - |0 PERI:(DE-600)1472968-4 |n 48 |p 485002 - |t Journal of physics / Condensed matter |v 24 |y 2012 |x 1361-648X |
909 | _ | _ | |p VDB |o oai:juser.fz-juelich.de:135197 |
909 | C | O | |p VDB |o oai:juser.fz-juelich.de:135197 |
910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 4 |6 P:(DE-Juel1)131022 |
913 | 2 | _ | |a DE-HGF |b Key Technologies |l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT) |1 G:(DE-HGF)POF3-520 |0 G:(DE-HGF)POF3-529H |2 G:(DE-HGF)POF3-500 |v Addenda |x 0 |
913 | 1 | _ | |a DE-HGF |b Schlüsseltechnologien |1 G:(DE-HGF)POF2-420 |0 G:(DE-HGF)POF2-421 |2 G:(DE-HGF)POF2-400 |v Frontiers of charge based Electronics |x 0 |4 G:(DE-HGF)POF |3 G:(DE-HGF)POF2 |l Grundlagen zukünftiger Informationstechnologien |
914 | 1 | _ | |y 2013 |
915 | _ | _ | |a JCR/ISI refereed |0 StatID:(DE-HGF)0010 |2 StatID |
915 | _ | _ | |a JCR |0 StatID:(DE-HGF)0100 |2 StatID |
915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0110 |2 StatID |b Science Citation Index |
915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0111 |2 StatID |b Science Citation Index Expanded |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0150 |2 StatID |b Web of Science Core Collection |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0199 |2 StatID |b Thomson Reuters Master Journal List |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0200 |2 StatID |b SCOPUS |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0300 |2 StatID |b Medline |
915 | _ | _ | |a Nationallizenz |0 StatID:(DE-HGF)0420 |2 StatID |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)1020 |2 StatID |b Current Contents - Social and Behavioral Sciences |
920 | 1 | _ | |0 I:(DE-Juel1)PGI-7-20110106 |k PGI-7 |l Elektronische Materialien |x 0 |
920 | 1 | _ | |0 I:(DE-82)080012_20140620 |k JARA-HPC |l JARA - HPC |x 1 |
980 | _ | _ | |a journal |
980 | _ | _ | |a VDB |
980 | _ | _ | |a I:(DE-Juel1)PGI-7-20110106 |
980 | _ | _ | |a I:(DE-82)080012_20140620 |
980 | _ | _ | |a UNRESTRICTED |
Library | Collection | CLSMajor | CLSMinor | Language | Author |
---|