000135202 001__ 135202
000135202 005__ 20210129211815.0
000135202 0247_ $$2doi$$a10.1063/1.3699315
000135202 0247_ $$2ISSN$$a0021-8979
000135202 0247_ $$2ISSN$$a1089-7550
000135202 0247_ $$2WOS$$aWOS:000303282403003
000135202 0247_ $$2Handle$$a2128/17110
000135202 037__ $$aFZJ-2013-03167
000135202 082__ $$a530
000135202 1001_ $$0P:(DE-Juel1)138081$$aLenser, Ch.$$b0$$eCorresponding author$$ufzj
000135202 245__ $$aProbing the oxygen vacancy distribution in resistive switching Fe-SrTiO3 metal-insulator-metal-structures by micro-x ray absorption near-edge structure
000135202 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2012
000135202 3367_ $$2DRIVER$$aarticle
000135202 3367_ $$2DataCite$$aOutput Types/Journal article
000135202 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1374049289_32307
000135202 3367_ $$2BibTeX$$aARTICLE
000135202 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000135202 3367_ $$00$$2EndNote$$aJournal Article
000135202 500__ $$3POF3_Assignment on 2016-02-29
000135202 536__ $$0G:(DE-HGF)POF2-421$$a421 - Frontiers of charge based Electronics (POF2-421)$$cPOF2-421$$fPOF II$$x0
000135202 588__ $$aDataset connected to CrossRef, juser.fz-juelich.de
000135202 7001_ $$0P:(DE-Juel1)VDB19176$$aKuzmin, A.$$b1
000135202 7001_ $$0P:(DE-HGF)0$$aPurans, J.$$b2
000135202 7001_ $$0P:(DE-HGF)0$$aKalinko, A.$$b3
000135202 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b4$$ufzj
000135202 7001_ $$0P:(DE-Juel1)130620$$aDittmann, R.$$b5$$ufzj
000135202 773__ $$0PERI:(DE-600)1476463-5$$a10.1063/1.3699315$$gVol. 111, no. 7, p. 076101 -$$n7$$p076101 -$$tJournal of applied physics$$v111$$x0021-8979$$y2012
000135202 8564_ $$uhttps://juser.fz-juelich.de/record/135202/files/1.3699315.pdf$$yOpenAccess
000135202 8564_ $$uhttps://juser.fz-juelich.de/record/135202/files/1.3699315.gif?subformat=icon$$xicon$$yOpenAccess
000135202 8564_ $$uhttps://juser.fz-juelich.de/record/135202/files/1.3699315.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
000135202 8564_ $$uhttps://juser.fz-juelich.de/record/135202/files/1.3699315.jpg?subformat=icon-700$$xicon-700$$yOpenAccess
000135202 8564_ $$uhttps://juser.fz-juelich.de/record/135202/files/1.3699315.pdf?subformat=pdfa$$xpdfa$$yOpenAccess
000135202 909CO $$ooai:juser.fz-juelich.de:135202$$pdnbdelivery$$pdriver$$pVDB$$popen_access$$popenaire
000135202 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)138081$$aForschungszentrum Jülich GmbH$$b0$$kFZJ
000135202 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131022$$aForschungszentrum Jülich GmbH$$b4$$kFZJ
000135202 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130620$$aForschungszentrum Jülich GmbH$$b5$$kFZJ
000135202 9132_ $$0G:(DE-HGF)POF3-529H$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vAddenda$$x0
000135202 9131_ $$0G:(DE-HGF)POF2-421$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vFrontiers of charge based Electronics$$x0
000135202 9141_ $$y2013
000135202 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000135202 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000135202 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000135202 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000135202 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000135202 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000135202 915__ $$0StatID:(DE-HGF)0010$$2StatID$$aJCR/ISI refereed
000135202 915__ $$0StatID:(DE-HGF)0400$$2StatID$$aAllianz-Lizenz / DFG
000135202 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000135202 915__ $$0StatID:(DE-HGF)1020$$2StatID$$aDBCoverage$$bCurrent Contents - Social and Behavioral Sciences
000135202 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000135202 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000135202 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000135202 980__ $$ajournal
000135202 980__ $$aVDB
000135202 980__ $$aUNRESTRICTED
000135202 980__ $$aI:(DE-Juel1)PGI-7-20110106
000135202 9801_ $$aFullTexts