%0 Journal Article
%A Lüth, H.
%A Apetz, R.
%A Vescan, L.
%T Determination of the valence band offset of Si/Si0.7Ge0.3/Si quantum wells using deep level transient spectroscopy
%J Journal of applied physics
%V 73
%N 11
%I American Institute of Physics
%M PreJuSER-135983
%P 7427 - 7430
%Z Record converted from JUWEL: 18.07.2013
%F PUB:(DE-HGF)16
%9 Journal Article
%R 10.1063/1.353984
%U https://juser.fz-juelich.de/record/135983