TY  - JOUR
AU  - Lüth, H.
AU  - Apetz, R.
AU  - Vescan, L.
TI  - Determination of the valence band offset of Si/Si0.7Ge0.3/Si quantum wells using deep level transient spectroscopy
JO  - Journal of applied physics
VL  - 73
IS  - 11
PB  - American Institute of Physics
M1  - PreJuSER-135983
SP  - 7427 - 7430
N1  - Record converted from JUWEL: 18.07.2013
LB  - PUB:(DE-HGF)16
DO  - DOI:10.1063/1.353984
UR  - https://juser.fz-juelich.de/record/135983
ER  -